发明名称 SUBSTRATE PROCESSOR AND METHOD THEREFOR
摘要 PURPOSE: A substrate processor and a method therefor are provided to increase uniformity of processing, when a substrate, e.g. a wafer is subjected to development processing, etc. CONSTITUTION: In a state where a wafer is held by a wafer holding section and a temperature controlled liquid is discharged to a rim area on a rear face of the wafer from flow channels, a developing solution is heaped on a front face of the wafer. Thereafter, the wafer is rotated for a predetermined period of time in a state where the temperature controlled liquid is discharged to the rim area on the rear face of the wafer from the flow channels, whereby developing is performed. The wafer is heated by the wafer holding section with a large heat capacity in an area close to a center of the wafer, and a liquid film of the temperature controlled liquid is formed in the rim area of the wafer, whereby the wafer is heated. At this time, the wafer is rotated, so that the developing solution is stirred.
申请公布号 KR20010030017(A) 申请公布日期 2001.04.16
申请号 KR20000043292 申请日期 2000.07.27
申请人 TOKYO ELECTRON LIMITED 发明人 ASAKA KOICHI;MATSUYAMA YUJI;NAGAMINE SHUICHI
分类号 H01L21/027;G03F7/30;H01L21/00;(IPC1-7):H01L21/027 主分类号 H01L21/027
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