发明名称 |
SEMICONDUCTOR AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A semiconductor and a method for fabricating the same are provided to perform efficiently a counter measure about a power noise by forming a capacitor in a desired position. CONSTITUTION: An interlayer dielectric is formed on a silicon substrate(101) by performing a CVD(Chemical Vapor Deposition) method. A photo-resist pattern is formed by performing a photo-lithography process. The interlayer dielectric is etched by using the photo-resist pattern as a mask. An aluminium film is formed by performing a metal film formation process using a depressing CVD method. A plurality of through-hole(B11,B12) is formed on the silicon substrate(101) by filling an aluminium film therein. A plurality of metal lines(M11,M12) is formed on the through-holes(B11,B12). |
申请公布号 |
KR20010029950(A) |
申请公布日期 |
2001.04.16 |
申请号 |
KR20000040721 |
申请日期 |
2000.07.14 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
MORIWAKI TOSHIYUK;SUZUKI RYOICHI;TAMARU MASAKI |
分类号 |
H01L27/04;H01L21/02;H01L21/60;H01L21/768;H01L23/522;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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