发明名称 SLICE THICKNESS SETTING METHOD FOR TWIN ASYMMETRICAL SCANNING AND X-RAY CT DEVICE
摘要 PURPOSE: To set a slice thickness for twin asymmetrical scanning by setting a first slice at a first detector string and setting a second slice whose thickness is different from the first slice thickness at a second detector string in a multi- detector. CONSTITUTION: This device moves the position of an X-ray beam and scans by using an X-ray beam width fixed to be double of a first slice thickness, and moves the position of the X-ray beam to a position where the counting value of a first detector string and that of a second detector string are matched (ST2 to ST5). The counting value at this time is stored (ST6). Next, the device moves the position of the X-ray beam and scans by using an X-ray beam width fixed to be the sum of the first slice thickness and the second slice thickness, and moves the position of the X-ray beam to a position where the counting value of the first detector string matches with a stored count value (ST7 to ST9).
申请公布号 KR20010029781(A) 申请公布日期 2001.04.16
申请号 KR20000030383 申请日期 2000.06.02
申请人 GE YOKOGAWA MEDICAL SYSTEMS, LTD. 发明人 NUKUI MASATAKE
分类号 G01B15/02;A61B6/03;(IPC1-7):G01B15/02 主分类号 G01B15/02
代理机构 代理人
主权项
地址