发明名称 High performance aluminum free active region semiconductor lasers
摘要 The semiconductor laser emitting light in the wavelength range of about 700 nm to 800 nm utilizes an aluminum-free active region layer. An epitaxial structure is grown on a GaAs or AlGaAs substrate and includes an active region layer, confinement layers adjacent the active region layer, and cladding layers adjacent the confinement layers. The active region layer comprises at least one compressively strained InGaAsP quantum well surrounded by transitional layers, with the composition and width of the active region selected to emit light at a selected wavelength, particularly between about 700 nm and 800 nm. High band-gap InGaAlP cladding layers and confinement layers may be utilized to suppress carrier leakage, and the epitaxial structure may be grown on a misoriented substrate to further reduce carrier leakage from the quantum well and improve the crystalline quality of the quantum well. The lasers are capable of operating at high powers with high reliability for longer lifetimes than are obtainable with laser structures emitting the same wavelength range which require the use of aluminum in the active region.
申请公布号 US6219365(B1) 申请公布日期 2001.04.17
申请号 US19980185354 申请日期 1998.11.03
申请人 WISCONSIN ALUMNI RESEARCH FOUNDATION 发明人 MAWST LUKE J.;BOTEZ DAN;AL-MUHANNA ABDULRAHMAN;WADE JEROME KENT
分类号 H01S5/32;H01S5/34;H01S5/343;(IPC1-7):H01S5/343 主分类号 H01S5/32
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