发明名称 APPARATUS FOR AUTOMATICALLY TESTING SECONDARY CELL AND TESTING METHOD
摘要 PROBLEM TO BE SOLVED: To evaluate the properties of a secondary cell having confidence corresponding to real circumstances. SOLUTION: An apparatus for automatically testing a secondary cell comprises a constant current/voltage source 11 for performing charging/pausing for a testing cell 30 connected with a pulse generator 23, constant current load 12 for making a discharging current of the testing cell 30 a constant current, a switch 14 connecting the testing cell 30 with the constant current/voltage source 11 or the constant current load 12, CPU 15, ROM 16, RAM 17, a printer 18, a display apparatus 20 and a keyboard 19, the CPU 15 controlling the switch 14 and the constant current/voltage source 11 to perform initial charging and pulse charging subsequent to the charging, intermittent charging or supplement charging by intermittent pulse charging and also controlling the switch 14 and the constant current load to perform the constant current discharging.
申请公布号 JP2001102097(A) 申请公布日期 2001.04.13
申请号 JP19990280914 申请日期 1999.10.01
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 HIRAI TOSHIRO;KANO YUKIYASU;ASAKURA KAORU
分类号 H02J7/00;G01R31/36;H01M10/44;H01M10/48;H02J7/04;H02J7/10;(IPC1-7):H01M10/48 主分类号 H02J7/00
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