发明名称 |
TEST SYSTEM FOR ELECTRONIC APPARATUS HAVING SELF-TESTING FUNCTION |
摘要 |
PROBLEM TO BE SOLVED: To provide a test system for an electronic device having a self-testing function to facilitate testing plural devices and moreover in a short time. SOLUTION: Plural electronic devices, i.e., devices 1 to be tested and having the self-testing functions are connected to a LAN 2, and a common test instruction device 3 is also connected to the LAN 2. Then the device 3 sends a test start message to the LAN 2 with broadcast transmission for executing simultaneously conducting test on plural devices 1.
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申请公布号 |
JP2001103068(A) |
申请公布日期 |
2001.04.13 |
申请号 |
JP19990281040 |
申请日期 |
1999.10.01 |
申请人 |
FUJITSU I-NETWORK SYSTEMS LTD |
发明人 |
SATO TAKAAKI;MOGI UMIHIKO |
分类号 |
H04L12/28;(IPC1-7):H04L12/28 |
主分类号 |
H04L12/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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