发明名称 TEST SYSTEM FOR ELECTRONIC APPARATUS HAVING SELF-TESTING FUNCTION
摘要 PROBLEM TO BE SOLVED: To provide a test system for an electronic device having a self-testing function to facilitate testing plural devices and moreover in a short time. SOLUTION: Plural electronic devices, i.e., devices 1 to be tested and having the self-testing functions are connected to a LAN 2, and a common test instruction device 3 is also connected to the LAN 2. Then the device 3 sends a test start message to the LAN 2 with broadcast transmission for executing simultaneously conducting test on plural devices 1.
申请公布号 JP2001103068(A) 申请公布日期 2001.04.13
申请号 JP19990281040 申请日期 1999.10.01
申请人 FUJITSU I-NETWORK SYSTEMS LTD 发明人 SATO TAKAAKI;MOGI UMIHIKO
分类号 H04L12/28;(IPC1-7):H04L12/28 主分类号 H04L12/28
代理机构 代理人
主权项
地址