| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which can perform a test of many device en bloc even in a test device testing a semiconductor integrated device in a state in which input/output pins are short-circuited. SOLUTION: Data read out en bloc from sub-arrays SBA0-SBA1 in a memory cell array 20 are compared by a data bus driving circuit 300, the data bus driving circuit 300 drives potentials of data buses DB, /DB with small amplitude in accordance with this compared result. A data holding circuit 600 holds fail information in which a fail bit may exist in accordance with data on the data buses DB, /DB. The data holding circuit 600 gives fail information to a pass/fail information output circuit 400 with big amplitude in accordance with indication from the outside, and further, a fail information is outputted to the outside.
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