| 摘要 |
PROBLEM TO BE SOLVED: To perform a voltage applying current measurement test and a current applying voltage measurement test simultaneously for the I/O pins of an electronic device. SOLUTION: An pin electronics 19 provided in a tester 100 for an electronic device 16 and inputting/outputting a signal to/from the I/O pins thereof comprises current sources 48, 50 outputting a desired current, a voltage generating section 21 generating a desired voltage, and a diode bridge 52 connected with the current sources, the voltage generating section and the I/O pins of the electronic device wherein the voltage generating section 21 comprises a section 27 for measuring a current being fed to the diode bridge 52 through a current measuring resistor 34 having a specified resistance.
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