发明名称 INSPECTION EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To obtain an inspection equipment producing accurate high frequency inspection results. SOLUTION: An equipment for inspecting an RF module 1 to be connected with an external frequency circuit comprises a contact unit 20 planted with conductive contact pins 32 touching the RF module 1 directly, and an inspection equipment body 27 connected with the contact unit 20 wherein the contact unit 20 is provided with a simulation circuit of the external frequency circuit being connected with the RF module, i.e., an SAW filter 22. According to the arrangement, high frequency can be inspected accurately.
申请公布号 JP2001099881(A) 申请公布日期 2001.04.13
申请号 JP19990274190 申请日期 1999.09.28
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NODA NAOTAKA;YAJIMA TAKAHIRO;TSUYAMA KAZUHIKO;MIKI TOSHINOBU
分类号 G01R1/067;G01R31/00;G01R31/28;H03H3/08;(IPC1-7):G01R31/00 主分类号 G01R1/067
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