| 摘要 |
PROBLEM TO BE SOLVED: To speed up the operation of a semiconductor memory by shortening the memory cell access time and cycle time. SOLUTION: This semiconductor memory is provided with a setting means (e.g. fuse circuit) by which the operation is checked by adjusting the timings of various signals such as the activating timing of a sense amplifier, the fall- down timing of a word line and the timing of the recovery operation (equalization) of a bit line in the testing stage of a chip and the timings of internal signals are eternally programmed (fixed) in the state of the highest operating speed confirmed to be operatable in the checking stage.
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