发明名称 PROJECTION ALIGNER AND METHOD FOR PROJECTION EXPOSURE METHOD
摘要 PROBLEM TO BE SOLVED: To reduce the chip rotation of plural shot regions to be exposed on a substrate to an ignorable level. SOLUTION: This projection aligner is provided with a stage(WST) on which a substrate W is placed, and a fiducial plate(FP) arranged on the stage in which a fiducial mark(FM) is formed, and a positioning means 14 for aligning a mask by using the fiducial mark, so that the substrate can be exposed by projecting the pattern of the mask to the substrate. In this case, the projecting means aligns the mask based on the mounting error of the substrate on the stage.
申请公布号 JP2001102301(A) 申请公布日期 2001.04.13
申请号 JP20000274552 申请日期 2000.09.11
申请人 NIKON CORP 发明人 NISHI TAKECHIKA
分类号 G03F7/22;G03F7/20;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/22
代理机构 代理人
主权项
地址