发明名称 TEST BURN-IN DEVICE AND METHOD OF CONTROL IN TEST BURN-IN DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a test burn-in device which realizes a self diagnostic test in a low-temperature or high-temperature state and also enables a simpler self diagnostic test. SOLUTION: A diagnostic unit 21 is provided in a test control part 20 and is connected with driver/comparator circuits 26 through a connecting cable in a thermostat 10. Moreover, the cable 11 in the tank 10 is constituted of a heat-resistant material, is connected with the unit 21 via a diagnostic unit connecting connector 14 by a connector 12 for the unit 21 and is connected with the circuits 26 via burn-in board connecting connectors 15 by a connector 13 for a burn-in board.
申请公布号 JP2001102419(A) 申请公布日期 2001.04.13
申请号 JP19990280518 申请日期 1999.09.30
申请人 ANDO ELECTRIC CO LTD 发明人 TASHIRO TAKASHI
分类号 G01R31/26;H01L21/66;(IPC1-7):H01L21/66 主分类号 G01R31/26
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