发明名称 METHOD FOR INSPECTING LINEAR POLARIZING PLATE
摘要 PROBLEM TO BE SOLVED: To accurately inspect a linear polarizing plate for a defect such as a flaw on the surface, foreign matter adhered to the surface, pinholes, or unevenness. SOLUTION: Light from outside of one face F1 of a linear polarizing plate 1 is prevented from shining on the one face F1. In this state, linear polarized light is irradiated on the other face F2 of the linear polarizing plate 1 so as to form a crossed nicol with the linear polarizing plate 1 for observing the other face F2.
申请公布号 JP2001099752(A) 申请公布日期 2001.04.13
申请号 JP19990274576 申请日期 1999.09.28
申请人 SUMITOMO CHEM CO LTD 发明人 KOBAYASHI SHINJI
分类号 G01M11/00;G02B5/30;(IPC1-7):G01M11/00 主分类号 G01M11/00
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