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发明名称
METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要
申请公布号
JPS6396577(A)
申请公布日期
1988.04.27
申请号
JP19860243621
申请日期
1986.10.13
申请人
MITSUBISHI ELECTRIC CORP
发明人
SEGAWA HIROSHI;NAKAGAWA SHINICHI
分类号
H03K19/00;G01R31/28
主分类号
H03K19/00
代理机构
代理人
主权项
地址
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