发明名称 TEST METHOD AND TEST DEVICE FOR CORRELATED DOUBLE SAMPLER
摘要 PROBLEM TO BE SOLVED: To propose a test method that can test a correlated double sampler for which a high-speed operation is required, by using an inexpensive device, and to propose a test device employing this test method. SOLUTION: In the correlated double sampler that is provided with a differential amplifier 17 and sample-hold circuits 15, 16 that conduct sampling with sampling clocks whose phases differ from each other and given to a noninverting input terminal and an inverting input terminal of this differential amplifier and uses the differential amplifier to extract a difference between sample-hold signals SB, SC sampled and held by the sample-hold circuits and to provided an output, whether or not the correlated double sampler is normally in operation is decided depending on whether or not a signal with a periodicity is outputted to an output terminal 18 in such a state that the sample-hold circuits 15, 16 receive a continuous wave with a frequency of about 1/100 of the frequency of the sampling clock and apply sampling and holding to the continuous wave.
申请公布号 JP2001103519(A) 申请公布日期 2001.04.13
申请号 JP19990273852 申请日期 1999.09.28
申请人 ADVANTEST CORP 发明人 KAMINARI SHIGERU
分类号 G01R31/316;H04N5/335;H04N5/357;H04N5/363;H04N5/372;H04N5/378;H04N17/00;(IPC1-7):H04N17/00 主分类号 G01R31/316
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