发明名称 POLISHING DEVICE AND ADJUSTING METHOD FOR POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a polishing device and its adjusting method, capable of facilitating the replacement of a cushioning material layer when the polishing device is to be adjusted, and of being high in operating performance, and in yield in wafer manufacture without generating polishing scraps by boring holes in the cushioning material layer. SOLUTION: In this invention, the wafer supporting part of a polishing device is furnished with a flat plate part 5 having back pressure gas introducing holes 7 and 8 introducing back pressure gas into a wafer 4, and with a cushioning material layer 6, and it is characteristic that the back pressure gas introducing hole 8 provided for the cushioning material layer 6 is greater in cross sectional area than the back pressure gas introducing hole 7 provided for the flat plate part 5.
申请公布号 JP2001096457(A) 申请公布日期 2001.04.10
申请号 JP19990275262 申请日期 1999.09.28
申请人 TOSHIBA MICROELECTRONICS CORP;TOSHIBA CORP 发明人 YAJIMA HIROMI;SHIGETA KENICHI;KOJIMA YASUHISA;IGUCHI KOJI
分类号 B24B37/04;B24B37/30;H01L21/304 主分类号 B24B37/04
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