发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent generation of particles while shortening a down time. SOLUTION: In a film forming process to form a film using CVD device having an inner tube in which a wafer is carried in and an outer tube surrounding the inner tube, when the accumulated film thickness of the inner tube reaches a preset value, a first parts exchanging step 41 to exchange only the inner tube is achieved, and then, a film forming step 30 is achieved after the parts are exchanged. When the accumulated film thickness reaches the preset value, a second parts exchanging step 42 is achieved to achieve the film forming step 30. After that, when the accumulated film thickness of the outer tube reaches the preset value, a full exchange step 50 to exchange the inner tube and the outer tube is achieved, and the film forming step 30 is achieved. Thus, the inner tube forming a maximum dust generating source can be cleaned, generation of particles can be prevented, and the stop time can be shorted by reducing the frequency of the full exchange.
申请公布号 JP2001098378(A) 申请公布日期 2001.04.10
申请号 JP19990271249 申请日期 1999.09.24
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 SUZAKI KENICHI
分类号 H01L21/22;C23C16/44;H01L21/205;(IPC1-7):C23C16/44 主分类号 H01L21/22
代理机构 代理人
主权项
地址