| 摘要 |
A device for self-testing of an analog-to-digital converter includes elements for applying to the converter test signals and analyzing elements. The analyzing elements include common resources (10,36) integrated in the circuit bearing the converter and capable of being configured to determine successively shift, gain and non-linearities of the converter and elements for configuring and controlling the common resources (10,36) so as to adapt them to the characteristics to be determined. |
