Semiconductor memory device capable of multiple word-line selection and method of testing same

摘要

A semiconductor memory device capable of conducting test operations includes a plurality of word drivers which keep word lines in an active state when the word drivers are selected until the word drivers are reset. The semiconductor memory device further includes a control circuit which successively selects more than one of the plurality of word drivers so as to achieve simultaneous activation of word lines corresponding to selected ones of the plurality of word drivers during the test operations.