发明名称 Forming contacts on semiconductor substrates, radiation detectors and imaging devices
摘要 A method, suitable for forming metal contacts on a semiconductor substrate at positions for defining radiation detector cells, includes the steps of forming one or more layers of material on a surface of the substrate with openings to the substrate surface at the contact positions; forming a layer of metal over the layer(s) of material and the openings; and removing metal overlying the layer(s) of material to separate individual contacts. Optionally, a passivation layer to be left between individual contacts on the substrate surface may be applied. Etchants used for removing unwanted gold (or other contact matter) are preferably prevented from coming into contact with the surface of the substrate, thereby avoiding degradation of the resistive properties of the substrate.
申请公布号 US6215123(B1) 申请公布日期 2001.04.10
申请号 US19990421115 申请日期 1999.10.19
申请人 SIMAGE OY 发明人 ORAVA RISTO O.;PYYHTIä JOUNI I.;SCHULMAN TOM G.;SARAKINOS MILTIADIS E.;SPARTIOTIS KONSTANTINOS E.;JALAS PANU Y.
分类号 G01T1/24;H01L21/28;H01L21/8234;H01L27/14;H01L27/146;H01L31/0224;H01L31/0264;(IPC1-7):G01T1/24 主分类号 G01T1/24
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