发明名称 Structure of a channel write/erase flash memory cell and manufacturing method and operating method thereof
摘要 A channel write/erase flash memory cell structure together with its method of manufacture and mode of operation. The flash memory cell structure is formed by implanting P-type ions into a substrate to form a shallow-doped region, and then implanting N-type ions to form the drain terminal of the flash memory cell. Next, a deep-doped region that acts as a P-well is formed underneath the drain terminal. Method of manufacturing the channel write/erase memory cell and its mode of operation is also discussed.
申请公布号 US6214668(B1) 申请公布日期 2001.04.10
申请号 US20000565989 申请日期 2000.05.04
申请人 E-MEMORY TECHNOLOGY, INC. 发明人 HSU CHING-HSIANG;YANG CHING-SONG
分类号 H01L21/8247;G11C16/10;H01L21/265;H01L21/336;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/336;H01L21/823;H01L21/425 主分类号 H01L21/8247
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