发明名称 |
Structure of a channel write/erase flash memory cell and manufacturing method and operating method thereof |
摘要 |
A channel write/erase flash memory cell structure together with its method of manufacture and mode of operation. The flash memory cell structure is formed by implanting P-type ions into a substrate to form a shallow-doped region, and then implanting N-type ions to form the drain terminal of the flash memory cell. Next, a deep-doped region that acts as a P-well is formed underneath the drain terminal. Method of manufacturing the channel write/erase memory cell and its mode of operation is also discussed.
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申请公布号 |
US6214668(B1) |
申请公布日期 |
2001.04.10 |
申请号 |
US20000565989 |
申请日期 |
2000.05.04 |
申请人 |
E-MEMORY TECHNOLOGY, INC. |
发明人 |
HSU CHING-HSIANG;YANG CHING-SONG |
分类号 |
H01L21/8247;G11C16/10;H01L21/265;H01L21/336;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/336;H01L21/823;H01L21/425 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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