| 摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus and a method for testing a semiconductor integrated circuit which is high in observability and capable of conveniently detecting the delay failure, the degeneration failure, etc. SOLUTION: The apparatus comprises a test pattern input means 14 for inputting a test pattern for activating a bus under test of a semiconductor integrated circuit 20 to this integrated circuit, a transient current measuring means 16 for measuring a transient power current fed to the semiconductor integrated circuit during activating of the bus under test, and a failure detecting means 34 for judging the existence of a failure on the bus under test, based on the transient power current measured by the transient power current measuring means.
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