发明名称 LENS CHARACTERISTIC INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To automatically measure and inspect a characteristic and an aberration of a lens in a short time with high precision by means of a simple structure without depending on any visual inspection by a worker. SOLUTION: A laser oscillating means 2 radiates a laser beam in the optical axis direction of a tested lens 1 to the tested lens 1, and an image of the laser beam transmitted through the tested lens 1 and focused on a cover glass 5 is expanded by means of a microscope 6 so as to be converted into an image signal by means of a camera 7. On the basis of the image data of the image signal inputted via an image storing means 8, a stage controlling means 9 moves the tested lens l via an XYZ gonio-stage 4 and a lens base 3 so as to control it for collecting the laser beams transmitted through the tested lens 1 on a single point. A length ratio computing measuring means 10 detect the center of gravity of the focused image and stores the length of the images focused around the center of gravity for storing a maximum length L and a minimum length S so as to measure a length ratio between L and S, and then, multiplies the length ratio by a fixed coefficient for computing a dimension of a non-point aberration.
申请公布号 JP2001091404(A) 申请公布日期 2001.04.06
申请号 JP19990265581 申请日期 1999.09.20
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OGAWA YOSHIHARU
分类号 G01M11/02;G01M11/00;(IPC1-7):G01M11/02 主分类号 G01M11/02
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