发明名称 NONCONTACT MEASURING DEVICE FOR LARGE SCALE INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide an easy noncontact measuring device for an LSI capable of measuring an electrical potential fluctuation in a power wiring in the LSI even if a seal structure of the LSI is not removed. SOLUTION: The device 1 is provided with an antenna 20 for receiving a radiation electromagnetic wave W from a power wiring in a LSI 10, a voltmeter 30 chronologically measuring an induced electromotive force vA by the radiation electromagnetic wave W received, a computing part 40 converting time series data P of a measurement result to a potential fluctuation vL produced in the LSI 10 by a conversion factor, an indication part 50 indicating the converted potential fluctuation vL to a measuring person. The antenna 20 is arranged in a neighborhood of the LSI 10 of a measuring object or in a state of contacting with an insulation part of the LSI 10. Preferably, an insulated metal plate 21 is added a back side of the antenna 20 to be covered against an unnecessary electromagnetic wave from other part.
申请公布号 JP2001091596(A) 申请公布日期 2001.04.06
申请号 JP19990265339 申请日期 1999.09.20
申请人 NEC CORP 发明人 AOYAMA SHINTARO
分类号 G01R31/302;G01R1/06;G01R29/08;G01R31/28;(IPC1-7):G01R31/302 主分类号 G01R31/302
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