发明名称 ORGANIC IRREGULAR REFLECTION PREVENTING FILM COMPOSITION AND PROCESS FOR PRODUCING SAME
摘要 PURPOSE: An irregular reflection preventing film composition capable of preventing irregular reflection in a lower film layer of a photoresist film in a process for forming an ultrafine pattern using ArF (193nm) light source during the production of a semiconductor and process for preparation thereof are provided which can produce a semiconductor element capable of remarkably reducing standing wave effect and having an excellent pattern form. CONSTITUTION: This irregular reflection preventing film composition comprises a cross-linking agent of formula 11 having a molecular weight of 4,000 to 12,000, an organic irregular reflection preventing base material of formula 12, a light absorbing agent, a thermal acid generator and an organic solvent. In formula, a : b is 0.1 to 1.0 : 0.1 to 1.0, R1 is H or methyl, R1, R2 are side chain or main chain substituted alkyl containing 1 to 5C, R3 is side chain or main chain substituted alkyl containing 1 to 5C.
申请公布号 KR20010026523(A) 申请公布日期 2001.04.06
申请号 KR19990037876 申请日期 1999.09.07
申请人 HYNIX SEMICONDUCTOR INC. 发明人 BAEK, GI HO;HONG, SEONG EUN;JUNG, JAE CHANG;JUNG, MIN HO;KONG, GEUN GYU;LEE, GEUN SU
分类号 C08F212/08;C08F216/38;C08K5/42;C08L25/08;C08L29/14;C08L33/06;C09D125/08;C09D129/14;G03F7/004;G03F7/038;G03F7/09;G03F7/11;H01L21/027;(IPC1-7):C07C31/20 主分类号 C08F212/08
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