发明名称 FUNCTION TEST METHOD FOR EXCHANGE SYSTEM
摘要 PURPOSE: A function test method for an exchange system is provided to utilize resources effectively and allow AFT(Auto Function Test) program to be quickly upgraded by incorporating the AFT program in the online program of a system and managing them in one task, after finishing producing the private exchange system such as key-phone system and PBX(Private Branch Exchange). CONSTITUTION: An AFT program according to the invention is incorporated in the online program and managed in one program(S100). Only when a hardware and software in the exchange system are initialized, the incorporated program performs backup after diagnosing and testing items which can be tested in AFT program(S110). If the I/O port in the corresponding exchange system is set to the default value(S120), a normal service is preformed(S130). If the above I/O port is set to AFT(S140), the corresponding AFT test is performed by being input AFT test command(S150). When a test is performed by AFT command in the S150, its response result is notified through the above I/O port(S160). Then, a PC sending/receiving environment is set, and the above response result is displayed on a PC(S170).
申请公布号 KR20010027451(A) 申请公布日期 2001.04.06
申请号 KR19990039199 申请日期 1999.09.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, CHUNG SU
分类号 H04M3/22;(IPC1-7):H04M3/22 主分类号 H04M3/22
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