发明名称 Hardening spin-on-glass planarising films on semiconductor wafer - by combined heating and UV exposure eliminating formation of fissures
摘要 <p>Process for hardening a spin on glass (SOG) film formed on a wafer film to insulate the metal layers from each other and to even out the step height difference in the prodn. of a multilayer metal layer of a highly integrated semiconductor device, comprises adjusting a heating chamber which has a source of UV light to a predetermined initial temp.; introducing a wafer carrying a spin on glass film to be hardened into the heated chamber and raising the temp. gradually to a predetermined max temp.; irradiating the SOG film with UV light of a predetermined wavelength while the max. temp. is maintained for a predetermined period; and cooling the wafer.</p>
申请公布号 NL9001383(A) 申请公布日期 1992.01.16
申请号 NL19900001383 申请日期 1990.06.18
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. TE KYUNGKI-DO, ZUID-KOREA. 发明人
分类号 H01L21/768 主分类号 H01L21/768
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