发明名称 |
Hardening spin-on-glass planarising films on semiconductor wafer - by combined heating and UV exposure eliminating formation of fissures |
摘要 |
<p>Process for hardening a spin on glass (SOG) film formed on a wafer film to insulate the metal layers from each other and to even out the step height difference in the prodn. of a multilayer metal layer of a highly integrated semiconductor device, comprises adjusting a heating chamber which has a source of UV light to a predetermined initial temp.; introducing a wafer carrying a spin on glass film to be hardened into the heated chamber and raising the temp. gradually to a predetermined max temp.; irradiating the SOG film with UV light of a predetermined wavelength while the max. temp. is maintained for a predetermined period; and cooling the wafer.</p> |
申请公布号 |
NL9001383(A) |
申请公布日期 |
1992.01.16 |
申请号 |
NL19900001383 |
申请日期 |
1990.06.18 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. TE KYUNGKI-DO, ZUID-KOREA. |
发明人 |
|
分类号 |
H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|