发明名称 |
DRY-CLEANING APPARATUS AND METHOD USED IN MANUFACTURING SEMICONDUCTOR |
摘要 |
PURPOSE: A dry-cleaning apparatus is provided to prevent a defect of a semiconductor device caused by polymer not completely eliminated, by effectively setting an interval of time taken for a dry-cleaning process according to the quantity of the polymer formed in a process chamber. CONSTITUTION: A gas supply unit(180) supplies gas into a process chamber(110). A radio frequency(RF) supplying unit(170) supplies RF power to an electrode installed inside the process chamber. A detecting unit detects impedance formed in the process chamber. A controller(200) controls operation of the gas supply unit and the RF power supplying unit, and stops the gas supply unit when the impedance inputted from the impedance detecting unit reaches a predetermined value.
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申请公布号 |
KR20010026045(A) |
申请公布日期 |
2001.04.06 |
申请号 |
KR19990037188 |
申请日期 |
1999.09.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SEO, JEONG GEUN |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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