发明名称 DRY-CLEANING APPARATUS AND METHOD USED IN MANUFACTURING SEMICONDUCTOR
摘要 PURPOSE: A dry-cleaning apparatus is provided to prevent a defect of a semiconductor device caused by polymer not completely eliminated, by effectively setting an interval of time taken for a dry-cleaning process according to the quantity of the polymer formed in a process chamber. CONSTITUTION: A gas supply unit(180) supplies gas into a process chamber(110). A radio frequency(RF) supplying unit(170) supplies RF power to an electrode installed inside the process chamber. A detecting unit detects impedance formed in the process chamber. A controller(200) controls operation of the gas supply unit and the RF power supplying unit, and stops the gas supply unit when the impedance inputted from the impedance detecting unit reaches a predetermined value.
申请公布号 KR20010026045(A) 申请公布日期 2001.04.06
申请号 KR19990037188 申请日期 1999.09.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SEO, JEONG GEUN
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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