发明名称 MODULE TEST METHOD
摘要 PURPOSE: A module test method is provided to reduce a module test time while processing a module test process according to a truth table, reduce occurrence of badness by a worker and improve working ration of an equipment and working efficiency. CONSTITUTION: A module transfered from a module transfer part in which a number of modules are loaded is inserted into a socket of a test part to process the first test(41,51). After the first test, a superior module is stored in a superior goods storage box(46), an inferior module is separated from the socket and inserted into another socket to process the second test(52). After the second test, a superior module is stored in a semi-superior goods storage box(42) and an inferior module is stored in a semi-inferior goods storage box(43). The modules stored in the semi-superior goods storage box and the semi- inferior goods storage box are inserted to a socket to process the third test(53,54). After the third test, a superior module and an inferior module are stored in the superior goods storage box and an inferior goods storage box(46,47) respectively while a module which had been stored in the semi-inferior goods storage box and decided to a superior module is inserted another socket to process the fourth test(55). After the fourth test, a superior module is stored in the superior goods storage box and an inferior module is sotred in the inferior goods storage box.
申请公布号 KR20010027049(A) 申请公布日期 2001.04.06
申请号 KR19990038611 申请日期 1999.09.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, SANG GYUN;LEE, CHANG HO;LEE, SE JIN;YOON, SANG CHEOL
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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