发明名称 INFRARED STRESS DISTRIBUTION IMAGE SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an infrared stress distribution image system in which a sampling period of temperature images by an infrared camera can be understood at a glance on a signal in synchronization with a load to be impressed on a sample. SOLUTION: In this infrared stress distribution image system, load is impressed on a sample in a predetermined period, and changes in the temperature of a sample surface based on thermoelasticity effects are divided into a positive temperature image and negative temperature image and are subjected to integration measurements by an infrared camera. Then the difference between the two integrated temperature images is obtained to obtain the frame image of a stress distribution. A signal in synchronization with the load to be impressed on the sample is displayed, and a sampling period of temperature images by the infrared camera and the center value of the sampling period are superposed on the signal and displayed.
申请公布号 JP2001091372(A) 申请公布日期 2001.04.06
申请号 JP19990272830 申请日期 1999.09.27
申请人 JEOL LTD 发明人 MASUKI AKIHISA
分类号 G01L1/00;G01J5/48;(IPC1-7):G01L1/00 主分类号 G01L1/00
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