发明名称 DEVICE FOR ATTACHING ALUMINUM OXIDE
摘要 PROBLEM TO BE SOLVED: To provide adhering treatment for forming a high quality aluminum oxide film by using low-pressure chemical vapor deposition(LPCVD) on a silicon substrate or an equivalent substrate by temperature controlling a steam transfer system during chemical vapor deposition of aluminum oxide. SOLUTION: A device in a chemical vapor deposition(CVD) system monitors the temperature of an actual wafer/substrate 10 during adhering treatment, and forms a high quality aluminum oxide film under real-time wafer/substrate control. In this case, source steam for LPCVD adhering aluminum oxide to a silicon substrate is repeatedly supplied exactly. This device is provided with a heated source substance, a heated transfer passage, heated inert gas discharge passages 21a-21c, pressure difference large flow rate controllers 24 and 28, a control system having a related valve, and a vacuum treatment chamber having a wall which is to be temperature-controlled as a complete source transfer system.
申请公布号 JP2001093895(A) 申请公布日期 2001.04.06
申请号 JP20000244146 申请日期 2000.08.11
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 BARBEE STEVEN G;RICHARD ANTHONY CONTEY;KOSTENKO ALEXANDER;SARMA NARAYANA V;WILSON DONALD L;WONG JUSTIN WAI-CHOW;ZUHOSKI STEVEN P
分类号 C23C16/40;C23C16/46;C23C16/52;H01L21/205;H01L21/31;(IPC1-7):H01L21/31 主分类号 C23C16/40
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