APPARATUS FOR TESTING IN SEMICONDUCTOR MEMORY DEVICE

摘要

PURPOSE: An apparatus for testing a ring time in a memory semiconductor device is provided to control point in time for enabling a word line. CONSTITUTION: The apparatus for testing in a memory semiconductor device is capable of controlling point in time for enabling word line in the outside of a chip by accepting an exterior information made by a mode set as an input. The exterior information is made by a specific mode set, the information cutting is made by a normal operation path in a testing mode or a specific mode and capable of controlling the test mode or the specific mode in the outside of the chip. The apparatus for testing is capable of controlling point in time at which a word line is enabled as controlling control signals(PXDC,PXDE) being applied from the outside of the chip.