发明名称 PLASMA ARC CUTTING APPARATUS, MANUFACTURING PROCESS AND DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problems that more than half of currently employed semiconductor processes are performed by decompressed devices, that a cleaning apparatus and aligner can be used only under atmospheric pressure, and that the interface between the devices operated under atmospheric pressure and those operated under reduced pressure cannot be constituted smoothly which becomes a bottleneck for efficient processes. SOLUTION: Plasma containing high-density radicals is formed linearly by using microwaves and damage-free and high-speed film formation, etching and so forth are performed so as to realize continuous machining of wafers or the like. Load locking becomes unnecessary by operating devices under substantially atmospheric pressure and isolating process spaces or the like by a gas flow. Since processes such as film formation, CVD, etching, planarization, cleaning and so forth can be conducted directly by only switching the gas, majority of processes can be performed under atmospheric pressure, thus enabling efficient processes.
申请公布号 JP2001093871(A) 申请公布日期 2001.04.06
申请号 JP19990309808 申请日期 1999.09.24
申请人 OMI TADAHIRO 发明人 OMI TADAHIRO;SHINOHARA HISAKUNI
分类号 B23K10/00;H01L21/205;H01L21/302;H01L21/304;H01L21/3065;H05H1/30 主分类号 B23K10/00
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