发明名称 METHOD OF FORMING SELF-ALIGNED CONTACT
摘要 PURPOSE: A method of forming a self-aligned contact is to form spacers doubly on a gate electrode, thereby improving insulation between the gate electrode and a conductive layer for a landing pad. CONSTITUTION: A gate electrode(322) is formed on a semiconductor substrate(310). A silicon nitride layer is deposited on the gate electrode, followed by etching back it, to form the first spacer(326) thereon. A BPSG(borophosphosilicate glass) film(328) is deposited on the entire surface of the substrate and is etched to form a self-aligned contact. Then, an etch selection ratio of the BPSG film relative to the silicon nitride layer of the first spacer is controlled to secure a sufficient contact area. Thereafter, another silicon nitride layer is deposited on the entire surface of the substrate, followed by etching back it to form the second spacer(332).
申请公布号 KR20010028055(A) 申请公布日期 2001.04.06
申请号 KR19990040114 申请日期 1999.09.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, YONG JIN;SUK, JONG UK;YOON, JEONG BONG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址