发明名称 |
METHOD OF FORMING SELF-ALIGNED CONTACT |
摘要 |
PURPOSE: A method of forming a self-aligned contact is to form spacers doubly on a gate electrode, thereby improving insulation between the gate electrode and a conductive layer for a landing pad. CONSTITUTION: A gate electrode(322) is formed on a semiconductor substrate(310). A silicon nitride layer is deposited on the gate electrode, followed by etching back it, to form the first spacer(326) thereon. A BPSG(borophosphosilicate glass) film(328) is deposited on the entire surface of the substrate and is etched to form a self-aligned contact. Then, an etch selection ratio of the BPSG film relative to the silicon nitride layer of the first spacer is controlled to secure a sufficient contact area. Thereafter, another silicon nitride layer is deposited on the entire surface of the substrate, followed by etching back it to form the second spacer(332).
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申请公布号 |
KR20010028055(A) |
申请公布日期 |
2001.04.06 |
申请号 |
KR19990040114 |
申请日期 |
1999.09.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, YONG JIN;SUK, JONG UK;YOON, JEONG BONG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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