发明名称 APPARATUS FOR CLEANING WAFER
摘要 PURPOSE: An apparatus for cleaning a wafer is provided to prevent remaining contaminant from being adhered to a wafer or from reducing cleaning efficiency in a subsequent process for cleaning the wafer, by effectively eliminating the contaminant remaining in a cleaning liquid or bath after a process for cleaning the wafer. CONSTITUTION: A chemical supplying/exhausting pipe(12) is formed in a bottom surface of a chemical bath(16). A chemical hole plate(11) is installed inside the chemical bath, and has filters in respective holes. A deionized(DI) water bath is installed in an outer portion of the chemical bath, and a DI water supplying pipe(13) is connected to the DI water bath. The DI water bath supplies DI water to the chemical bath through a DI water supplying hole(14).
申请公布号 KR20010028185(A) 申请公布日期 2001.04.06
申请号 KR19990040281 申请日期 1999.09.18
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 SHIN, JEONG HO
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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