发明名称 SYSTEM FOR MEASURING FLATNESS OF MASK OF EXPOSURE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a system for measuring the flatness of mask which is capable of easily measuring the flatness of the mask of an exposure device of a proximity system with high accuracy and is excellent in versatility. SOLUTION: The system for measuring the flatness of the mask comprises plural contact type displacement sensors 21 which are freely attachably and detachably mounted at an exposure chuck 2, a sensor amplifier 22 which amplifies the signals from respective plural contact type displacement sensors 21 and a personal computer 23 which is inputted with the signals from the respective contact type displacement sensors 21 amplified by the sensor amplifier 22 and is previously installed with a program (sensor signal processing software, chart computing software, etc.), for converting and outputting these input signals to the information on the flatness of the mask 8.
申请公布号 JP2001092155(A) 申请公布日期 2001.04.06
申请号 JP19990266624 申请日期 1999.09.21
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 KOZUKA TOSHIYUKI;KODAMA MASAYOSHI;MATSUYAMA KATSUAKI
分类号 H01L21/027;G01B5/28;G03F9/00;(IPC1-7):G03F9/00 主分类号 H01L21/027
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