发明名称 |
SYSTEM FOR MEASURING FLATNESS OF MASK OF EXPOSURE DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a system for measuring the flatness of mask which is capable of easily measuring the flatness of the mask of an exposure device of a proximity system with high accuracy and is excellent in versatility. SOLUTION: The system for measuring the flatness of the mask comprises plural contact type displacement sensors 21 which are freely attachably and detachably mounted at an exposure chuck 2, a sensor amplifier 22 which amplifies the signals from respective plural contact type displacement sensors 21 and a personal computer 23 which is inputted with the signals from the respective contact type displacement sensors 21 amplified by the sensor amplifier 22 and is previously installed with a program (sensor signal processing software, chart computing software, etc.), for converting and outputting these input signals to the information on the flatness of the mask 8. |
申请公布号 |
JP2001092155(A) |
申请公布日期 |
2001.04.06 |
申请号 |
JP19990266624 |
申请日期 |
1999.09.21 |
申请人 |
HITACHI ELECTRONICS ENG CO LTD |
发明人 |
KOZUKA TOSHIYUKI;KODAMA MASAYOSHI;MATSUYAMA KATSUAKI |
分类号 |
H01L21/027;G01B5/28;G03F9/00;(IPC1-7):G03F9/00 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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