发明名称 |
Semiconductor memory device. |
摘要 |
<p>A circuit for carrying out ordinary "write" and "read" operation during operation of applying a test voltage to a cell opposite electrode in test operation is provided. The circuit converts a test mode instruction signal to an ordinary operation instruction signal in a semiconductor memory device. The test mode instruction signal can be applied to an input pin of the semiconductor memory device, so that the test operation can be carried out even after the assembly of the semiconductor memory device. <IMAGE></p> |
申请公布号 |
EP0488425(A1) |
申请公布日期 |
1992.06.03 |
申请号 |
EP19910120686 |
申请日期 |
1991.12.02 |
申请人 |
NEC CORPORATION |
发明人 |
SHIBATA, KAZUO, NEC CORPORATION |
分类号 |
G11C11/401;G11C11/404;G11C29/00;G11C29/06;G11C29/50 |
主分类号 |
G11C11/401 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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