| 摘要 |
PURPOSE: A circuit and a method for detecting a defect cell in a semiconductor device are provided to exactly detect a defect memory cell and the position of the defect memory cell through current detectors built in as the least number and minimize degradation of an operation speed by the current detectors at a normal operation. CONSTITUTION: The circuit includes a memory cell array(100) and a large number of defect cell detecting portions(140-144). The memory cell array includes a large number of memory blocks(110-114) having a large number of memory cells(116) being, correspondently to a predetermined memory address, addressed. The large number of defect cell detecting portions correspond to each of the large number of memory blocks, compare a current, which is generated from the corresponding memory blocks, with a reference current and respectively detect whether a memory cell being addressed is a defect memory cell or not.
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