SEMICONDUCTOR CONTROL DEVICE

摘要

PROBLEM TO BE SOLVED: To prevent malfunction of sample-hold of correct data caused by a switching noise accompanying open-operation of a switch of an other sample- hold circuit during sample-hold of data in any one sample-hold circuit when the device is provided with a plurality of sample-hold circuits incorporating a switch and sample-hold of data is performed in order using the plurality of sample-hold circuits. SOLUTION: A switch control circuit 20 outputs successively switch control signals SH1-SH3 to plural sample-hold circuits 1-3. For example, a first switch opening/closing circuit 21 outputs a closing signal to a second switch opening/ closing circuit 22 through a signal line 31 adjusting to finish of sample-hold of data in the sample-hold circuit 1. A second switch opening/closing circuit 22 does not output a switch control signal SH2 from the switch control circuit 20 to the sample-hold circuit 2 before the circuit receives the closing signal.