发明名称 INTEGRATED CIRCUIT DEVICE HAVING BOUNDARY SCAN CELL
摘要 PURPOSE: An integrated circuit device capable of externally forming a boundary scan cell of a core having a tri-state output port or a bidirectional port without time delay on a data path is provided. CONSTITUTION: The device includes the core(110) having the bidirectional port(210) and/or the tri-state output port(220). The core(110) has a logic circuit(115) contained therein. The device further includes a boundary scan cell block(150) connected to the bidirectional port(210) or the tri-state output port(220) to load or capture test data. The boundary scan cell block(150) has a tri-state buffer(152) and a plurality of boundary scan cells(154,156,158). The tri-state buffer(152) has an input terminal(I), a control input terminal(C) and an output terminal(O). The input terminal(I) and the control input terminal(C) are respectively connected to the boundary scan cells(154,156) for loading the data to the bidirectional port(210) or the tri-state output port(220). On the other hand, the output terminal(O) is connected to the other boundary scan cell(158) for capturing the data from the bidirectional port(210) or the tri-state output port(220).
申请公布号 KR20010027121(A) 申请公布日期 2001.04.06
申请号 KR19990038706 申请日期 1999.09.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SIM, GYU CHAN
分类号 H01L27/00;(IPC1-7):H01L27/00 主分类号 H01L27/00
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