发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device the size of which can be reduced by arranging a wiring layer and an insulating layer under an electrode for power supply and signal and a method for manufacturing the device. SOLUTION: In a semiconductor device in which an electrode 1 for power supply and signal provided in the uppermost portion of a single-crystal silicon substrate 3 and a lead frame are connected to each other through thin metallic wires 2, the upper surfaces of all insulating layers formed between the substrate 3 and electrode 1 are flattened. In addition, a flat layer wiring layer having a size equivalent to that of the electrode 1 is formed in a grid between the substrate 3 and electrode 1. It is also possible to form an element, such as the transistor, etc., in the surface layer section of the substrate 3 between the substrate 3 and electrode 1.</p>
申请公布号 JP2001093906(A) 申请公布日期 2001.04.06
申请号 JP19990269277 申请日期 1999.09.22
申请人 TOSHIBA CORP 发明人 ISHIKAWA HISAMITSU
分类号 H01L21/3205;H01L21/82;H01L23/52;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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