发明名称 |
REDISTRIBUTED WAFER LEVEL CHIP SIZE PACKAGE HAVING CONCAVE PATTERN IN BUMP PAD AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>PURPOSE: A redistributed wafer level chip size package(WLCSP) having a concave pattern in a bump pad is provided to increase a junction area and improve adhesion, by forming a concave pattern in a bump pad area to make a joint surface become rough. CONSTITUTION: A semiconductor chip includes a semiconductor substrate and a plurality of chip pads(54) exposed to a gap between passivation layers(56) formed on the semiconductor substrate. The first polymer layer(58) is formed on the passivation layer. The first under barrier metal(UBM)(60) of a predetermined pattern is formed on the chip pad and the first polymer layer. A redistributed lane(64) is formed on the first UBM, electrically to the chip pad, including a concave pattern. The second polymer layer(74) is formed on the first polymer layer and the redistributed lane, and defines a region of a bump pad exposing a part of the concave pattern and the redistributed lane. The second UBM(78) is formed on the bump pad. A solder bump(80) is formed on the second UBM, electrically connected to the redistributed lane. A joint surface of the bump pad and the solder bump is made rough by the concave pattern formed inside the region of the bump pad.</p> |
申请公布号 |
KR20010029196(A) |
申请公布日期 |
2001.04.06 |
申请号 |
KR19990041883 |
申请日期 |
1999.09.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, CHAN SEUNG;JUNG, SEUNG UK |
分类号 |
H01L21/60;H01L23/31;H01L23/485;(IPC1-7):H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|