发明名称 ION SCATTERING ANALYSER
摘要 PURPOSE:To obtain an ion scattering analyser having a structure capable of performing the mounting and attachment of a sample to be analyzed and the feed of the sample between a vacuum chamber and other vacuum device under vacuum. CONSTITUTION:A vacuum chamber 2 having a sample arranged therein formed into a structure so as to be separated from an analyser main body 1 and capable of being mounted on the main body 1 in a freely detachable manner. A freely openable and closable door 21 for partitioning the interior and exterior of the vacuum chamber 2 in an airtight manner is provided on the mounting part of the vacuum chamber 2 on the main body 1.
申请公布号 JPH0510894(A) 申请公布日期 1993.01.19
申请号 JP19910160475 申请日期 1991.07.01
申请人 SHIMADZU CORP 发明人 KONISHI IKUO
分类号 G01N23/225 主分类号 G01N23/225
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