发明名称 Electron beam drawing method in which cell projection manner and variably shaped beam manner are used in combination
摘要 Whether a pattern region in which a pattern is drawn in a resist is a first region to be drawn in a cell projection manner or a second region to be drawn in a variably shaped beam manner is decided. Then a first exposure dose is selected if the pattern region is the first region or a second exposure dose is selected if the pattern region is the second region. The second exposure dose is different from the first exposure dose. The pattern is drawn with the first exposure dose in the first region and with the second exposure dose in the second region respectively.
申请公布号 US6211528(B1) 申请公布日期 2001.04.03
申请号 US19980055755 申请日期 1998.04.07
申请人 NEC CORPORATION 发明人 TAMURA TAKAO
分类号 G03F7/20;H01J37/302;H01L21/027;(IPC1-7):H01J37/302 主分类号 G03F7/20
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