发明名称 Method for manufacturing PMOS transistor
摘要 A method for manufacturing a PMOS transistor. A gate terminal is formed over a substrate. Spacers are formed on the sidewalls of the gate terminal. A source/drain terminal is formed in the substrate on each side of the gate terminal, and then a metal silicide layer is formed over the top surface of the gate terminal and the substrate. The spacers are next removed. Using the metal silicide layer as a mask, a source/drain extension region is formed in the substrate between the gate terminal and the source/drain terminal. Similarly, using the metal silicide layer as a mask, an anti-punchthrough region is form in the substrate interior under the source/drain extension region.
申请公布号 US6211027(B1) 申请公布日期 2001.04.03
申请号 US19990444278 申请日期 1999.11.19
申请人 UNITED MICROELECTRONICS CORP.;UNITED SILICON INCORPORATED 发明人 LIN TONY;HSUE C. C.
分类号 H01L21/266;H01L21/336;H01L29/10;(IPC1-7):H01L21/336 主分类号 H01L21/266
代理机构 代理人
主权项
地址