| 摘要 |
PROBLEM TO BE SOLVED: To provide a component inspection apparatus capable of minimizing the delay of a comparison operation process and a decrease in scanning accuracy. SOLUTION: This component inspection apparatus detects whether or not the shape or nature of each conductor component W is defective, based on a change in magnetic flux of a predetermined magnetic field when the conductor component W is brought close to the predetermined magnetic field. Component supply means 16, 17, 18, 19 are provided for supplying the conductor components into the magnetic field along a certain direction and at a certain timing.
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