发明名称 DISK FOR EXAMINATION
摘要 PROBLEM TO BE SOLVED: To provide a disk for examination with which the data of plural fault pattern parts can be read only by once rotating a disk and time required for confirming a reproducing ability in respect to all fault patterns can be remarkably shortened. SOLUTION: Concerning the disk for examination having concentric data tracks 6 on a disk 8 for reading data stored on these data tracks 6, plural fault patterns 1, 2 and 3 are located on single or respective plural data tracks 6 on the disk 8.
申请公布号 JP2001084650(A) 申请公布日期 2001.03.30
申请号 JP19990257371 申请日期 1999.09.10
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 IKEUCHI TETSUYA;TANIGUCHI YASUSHI;SUGA YOSHITOMI
分类号 G11B20/18;G11B7/26;(IPC1-7):G11B7/26 主分类号 G11B20/18
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