发明名称 |
DISK FOR EXAMINATION |
摘要 |
PROBLEM TO BE SOLVED: To provide a disk for examination with which the data of plural fault pattern parts can be read only by once rotating a disk and time required for confirming a reproducing ability in respect to all fault patterns can be remarkably shortened. SOLUTION: Concerning the disk for examination having concentric data tracks 6 on a disk 8 for reading data stored on these data tracks 6, plural fault patterns 1, 2 and 3 are located on single or respective plural data tracks 6 on the disk 8.
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申请公布号 |
JP2001084650(A) |
申请公布日期 |
2001.03.30 |
申请号 |
JP19990257371 |
申请日期 |
1999.09.10 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
IKEUCHI TETSUYA;TANIGUCHI YASUSHI;SUGA YOSHITOMI |
分类号 |
G11B20/18;G11B7/26;(IPC1-7):G11B7/26 |
主分类号 |
G11B20/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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