| 摘要 |
PROBLEM TO BE SOLVED: To eliminate an adverse effect exerted on an inverted microscope when an observation device such as a heavy image pickup device is arranged at an optical path under the inverted microscope. SOLUTION: This inverted microscope device is provided with the inverted microscope 50 obtained by arranging an objective lens under a sample and forming a light guiding aperture part 51 guiding light transmitted through the objective lens more downward at a bottom surface part, the observation device 60 arranged under the microscope 50 so as to observe an image of the sample by the light transmitted through the aperture part 51, a working table 70 having an aperture part 71 being larger than the external size of the observation device 60 and supporting at least the microscope 50 and a supporting member 80 having an optical path 81 guiding the light from the aperture part 51 to the observation device 60 and supporting the microscope 50 on a condition that it is placed on the table 70. Since the weight of the observation device 60 is supported by the supporting member 80, the adverse effect exerted on the microscope 50 by the heavy observation device 60 is eliminated.
|
