发明名称 |
PRODUCTION OF SEMICONDUCTOR THIN FILM AND SEMICONDUCTOR DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a high-performance photorefractive element or optical switch by providing a process for producing a semiconductor thin film capable of forming p-type GaAs thin films of a carrier concentration sufficient as a contact layer without deteriorating the absorption change characteristic or refractive index change characteristic of the compound semiconductor thin film of an AlGaASs/GaAs system or InGaAs/GaAs system. SOLUTION: This process for producing the semiconductor thin film is for production of the compound semiconductor 7 of the AlGaASs/GaAs system or InGaAs/GaAs system having the p-type GaAs thin film 3 as the contact layer. The substrate temperature at the crystal growth of the part type GaAs thin film 3 is set at a range of 260 to 300 deg.C and doped with at least Be as a p-type impurity, by which the p-type GaAs tin film 3 is formed.</p> |
申请公布号 |
JP2001083556(A) |
申请公布日期 |
2001.03.30 |
申请号 |
JP19990258957 |
申请日期 |
1999.09.13 |
申请人 |
KUBOTA CORP |
发明人 |
IGAWA SATOSHI;YAMAMOTO MASAMI |
分类号 |
H01L21/205;G02F1/35;H01L21/203;H01L31/10;(IPC1-7):G02F1/35 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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