发明名称 PRODUCTION OF SEMICONDUCTOR THIN FILM AND SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a high-performance photorefractive element or optical switch by providing a process for producing a semiconductor thin film capable of forming p-type GaAs thin films of a carrier concentration sufficient as a contact layer without deteriorating the absorption change characteristic or refractive index change characteristic of the compound semiconductor thin film of an AlGaASs/GaAs system or InGaAs/GaAs system. SOLUTION: This process for producing the semiconductor thin film is for production of the compound semiconductor 7 of the AlGaASs/GaAs system or InGaAs/GaAs system having the p-type GaAs thin film 3 as the contact layer. The substrate temperature at the crystal growth of the part type GaAs thin film 3 is set at a range of 260 to 300 deg.C and doped with at least Be as a p-type impurity, by which the p-type GaAs tin film 3 is formed.</p>
申请公布号 JP2001083556(A) 申请公布日期 2001.03.30
申请号 JP19990258957 申请日期 1999.09.13
申请人 KUBOTA CORP 发明人 IGAWA SATOSHI;YAMAMOTO MASAMI
分类号 H01L21/205;G02F1/35;H01L21/203;H01L31/10;(IPC1-7):G02F1/35 主分类号 H01L21/205
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