发明名称 METHOD AND APPARATUS FOR DETECTING DEGRADATION OF ELECTRIC DOUBLE LAYER CAPACITOR
摘要 <p>PROBLEM TO BE SOLVED: To enable to judge the state of degradation of electric double layer capacitors in a live system without disconnecting them from the circuit and to judge their state of degradation in a non-contact manner. SOLUTION: Temperature rising of electric double layer capacitors 18 is measured while they are connected to the circuit in a live-line state and voltage is applied to them. By measuring the temperature rising, increase in inner resistance R as an index of degradation of the electric double layer capacitors 18 is read. To be more specific, the temperature of the electric double layer capacitors 18 before charging is measured while the electric double layer capacitors 18 are connected to the circuit and is recorded, then their temperature during charging and discharging operation is measured and the difference in temperature is observed. In this way, the change in inner resistance of the electric double layer capacitors 18 under service conditions can be read. The temperature measurement is performed by using a high-sensitivity radiation thermometer in a non-contact manner. A more precise judgment can be made by measuring multiple points on the electric double layer capacitors 18 and obtaining a mean value.</p>
申请公布号 JP2001085283(A) 申请公布日期 2001.03.30
申请号 JP19990263454 申请日期 1999.09.17
申请人 ELNA CO LTD 发明人 NINOMIYA TAMOTSU;KIMURA YOSHIKATSU;SHIMIZU HIDEO
分类号 H01G11/00;G01N25/72;H01G11/22;H01G11/32;H01G11/38;H01G11/42;H01G11/46;H01G11/48;H01G11/78;H01G13/00;(IPC1-7):H01G13/00;H01G9/155 主分类号 H01G11/00
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